Quantification of void network architectures of suspension...

Materials Science and Engineering: A 2010 Vol. 528; Iss. 1

Quantification of void network architectures of suspension plasma-sprayed (SPS) yttria-stabilized zirconia (YSZ) coatings using Ultra-small-angle X-ray scattering (USAXS)

Antoine Bacciochini, Jan Ilavsky, Ghislain Montavon, Alain Denoirjean, Fadhel Ben-ettouil, Stéphane Valette, Pierre Fauchais, Karine Wittmann-teneze
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Volume:
528
Year:
2010
Language:
english
Pages:
12
DOI:
10.1016/j.msea.2010.06.082
File:
PDF, 1.46 MB
english, 2010
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