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Strain Measurement by Local Diffraction: NanoBeam Electron Diffraction (NBED) Compared to Convergent Beam (CBED) and Dark Holography
Rouvière, J, Béché, A, Denneulin, T, Cooper, DVolume:
17
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927611006210
Date:
July, 2011
File:
PDF, 10.27 MB
english, 2011