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Electrical Properties of TaOx Thin Films for ReRAM Prepared by Reactive RF Magnetron Sputtering Method
Fukuda, Natsuki, Kurihara, Hidenao, Horita, Kazumasa, Yoshida, Yoshiaki, Kokaze, Yutaka, Nishioka, Yutaka, Suu, KoukouVolume:
1250
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-1250-g12-12
Date:
January, 2010
File:
PDF, 205 KB
english, 2010