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Modeling and characterization of atomically sharp “perfect” Ge/SiO2 interfaces
Wolfgang Windl, Tao Liang, Sergei Lopatin, Gerd DuscherVolume:
114-115
Year:
2004
Language:
english
Pages:
6
DOI:
10.1016/j.mseb.2004.07.041
File:
PDF, 349 KB
english, 2004