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Thermal stability of Ni/Ti/Al ohmic contacts to p-type 4H-SiC
Yu, Hailong, Zhang, Xufang, Shen, Huajun, Tang, Yidan, Bai, Yun, Wu, Yudong, Liu, Kean, Liu, XinyuVolume:
117
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4905832
Date:
January, 2015
File:
PDF, 4.70 MB
english, 2015