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Theory and Realization of a Two-Layer Hall Effect Measurement Concept for Characterization of Epitaxial and Implanted Layers of SiC
Schöner, Adolf, Rottner, Kurt, Nordell, NilsVolume:
423
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-423-661
Date:
January, 1996
File:
PDF, 419 KB
english, 1996