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Advancing Materials Characterization in the FIB-SEM with Transmission Kikuchi Diffraction
Bauer, F., Sitzman, S., Lang, C., Hartfield, C., Goulden, J.Volume:
20
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927614003353
Date:
August, 2014
File:
PDF, 1.40 MB
english, 2014