Investigation of traps in AlGaN/GaN HEMTs by current...

Materials Science and Engineering: C 2006 Vol. 26; Iss. 2-3

Investigation of traps in AlGaN/GaN HEMTs by current transient spectroscopy

M. Gassoumi, J.M. Bluet, F. Chekir, I. Dermoul, H. Maaref, G. Guillot, A. Minko, V. Hoel, C. Gaquière
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Volume:
26
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.msec.2005.10.033
File:
PDF, 199 KB
english, 2006
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