Electrical characterization of thiols self-assembled layers...

Materials Science in Semiconductor Processing 2008 Vol. 11; Iss. 5-6

Electrical characterization of thiols self-assembled layers on GaP (1 1 1) structures

R.V. Ghita, V. Lazarescu, C. Logofatu, C.C. Negrila, M.F. Lazarescu
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Volume:
11
Year:
2008
Language:
english
Pages:
4
DOI:
10.1016/j.mssp.2008.11.012
File:
PDF, 207 KB
english, 2008
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