Measurement of the ratio of substitutional to interstitial dopant-incorporation in nanostructures
Niermann, T, Mai, D, Zenneck, J, Roever, M, Malindretos, J, Rizzi, A, Seibt, MVolume:
13
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927607082141
Date:
September, 2007
File:
PDF, 368 KB
english, 2007