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Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis
Lutterotti, Luca, Vasin, Roman, Wenk, Hans-RudolfVolume:
29
Language:
english
Journal:
Powder Diffraction
DOI:
10.1017/s0885715613001346
Date:
March, 2014
File:
PDF, 491 KB
english, 2014