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Loss characterization of Mo-doped FeNi flake for DC-to-DC converter and MHz frequency applications
Zhou, Yang, Kou, Xiaoming, Mu, Mingkai, McLaughlin, Brandon M., Chen, Xing, Parsons, Paul E., Zhu, Hao, Ji, Alex, Lee, Fred C., Xiao, John Q.Volume:
111
Year:
2012
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.3677310
File:
PDF, 1.15 MB
english, 2012