Study of electromagnetic field stress impact on SiGe...

International Journal of Microwave and Wireless Technologies 2009 / 12 Vol. 1; Iss. 6

Study of electromagnetic field stress impact on SiGe heterojunction bipolar transistor performance

Alaeddine, Ali, Kadi, Moncef, Daoud, Kaouther, Maanane, Hichame, Eudeline, Philippe
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Volume:
1
Language:
english
Journal:
International Journal of Microwave and Wireless Technologies
DOI:
10.1017/S1759078709990572
Date:
December, 2009
File:
PDF, 775 KB
english, 2009
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