The Dynamic Ultrasound Influence on the Diffusion and Drift...

MRS Proceedings 2007 / 1 Vol. 994

The Dynamic Ultrasound Influence on the Diffusion and Drift of the Charge Carriers in Silicon p-n Structures

Burbelo, Roman M., Olikh, Oleg Y., Hinders, Mark K.
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Volume:
994
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-0994-f03-11
Date:
January, 2007
File:
PDF, 137 KB
english, 2007
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