![](/img/cover-not-exists.png)
[IEEE 2014 IEEE International Test Conference (ITC) - Seattle, WA, USA (2014.10.20-2014.10.23)] 2014 International Test Conference - Bayesian model fusion: Enabling test cost reduction of analog/RF circuits via wafer-level spatial variation modeling
Zhang, Shanghang, Li, Xin, Blanton, R. D., da Silva, Jose Machado, Carulli, John M., Butler, Kenneth M.Year:
2014
Language:
english
DOI:
10.1109/test.2014.7035328
File:
PDF, 835 KB
english, 2014