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Experimental Benchmarking of Pu Electronic Structure
Tobin, James G, Moore, K T, Chung, B W, Wall, M A, Schwartz, A J, Ebbinghaus, B B, Butterfield, M T, Teslich, N E, Bliss, R A, Morton, S A, Yu, S W, Komesu, T, Waddill, G D, Van Der Laan, G, Kutepov,Volume:
893
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-0893-JJ03-05
Date:
January, 2005
File:
PDF, 668 KB
english, 2005