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ECS Transactions [ECS China Semiconductor Technology International Conference 2012 (CSTIC 2012) - Shanghai, China (March 18 - March 19, 2012)] - Worst Case Stress Conditions for Hot Carrier Degradation with Technology Nodes from 0.35[micro sign]m to 45nm
Chen, Zhaoxing, Ji, Xiaoli, Yan, Fen, Shi, Yi, Song, Yongliang, Wu, Jeff, Guo, QiangYear:
2012
Language:
english
DOI:
10.1149/1.3694442
File:
PDF, 233 KB
english, 2012