In situ microscopic surface characterization studies of...

Journal of Materials Research 2001 / 3 Vol. 16; Iss. 3

In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy

Bobji, M. S., Bhushan, Bharat
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Volume:
16
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.2001.0110
Date:
March, 2001
File:
PDF, 1.03 MB
english, 2001
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