Atom-probe field ion microscope analysis of surfaces of...

Journal of Materials Research 1989 / 12 Vol. 4; Iss. 6

Atom-probe field ion microscope analysis of surfaces of materials

Tsong, Tien T., Chen, Chong-lin, Liu, Jiang
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Volume:
4
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.1989.1549
Date:
December, 1989
File:
PDF, 1.85 MB
english, 1989
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