The X-ray quantum efficiency measurement of high...

The X-ray quantum efficiency measurement of high resistivity CCDs

Murray, Neil J., Holland, Andrew D., Smith, David R., Gow, Jason P., Pool, Peter J., Burt, David J.
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Volume:
604
Language:
english
Pages:
3
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2009.01.052
Date:
June, 2009
File:
PDF, 357 KB
english, 2009
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