Spatial resolution analysis of micron resolution silicon...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2009 / 6 Vol. 604; Iss. 1-2

Spatial resolution analysis of micron resolution silicon pixel detectors based on beam and laser tests

Andricek, Ladislav, Doležal, Zdeněk, Drásal, Zbyněk, Fischer, Peter, Kodyš, Peter, Kohrs, Robert, Kvasnička, Peter, Mariñas, Carlos, Reuen, Lars, Rummel, Stefan, Schmieden, Kristof, Velthuis, Jaap J.,
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Volume:
604
Language:
english
Pages:
5
Journal:
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
DOI:
10.1016/j.nima.2009.01.097
Date:
June, 2009
File:
PDF, 455 KB
english, 2009
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