Two-dimensional measurement of focused hard X-ray beam...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2010 Vol. 616; Iss. 2-3

Two-dimensional measurement of focused hard X-ray beam profile using coherent X-ray diffraction of isolated nanoparticle

Yukio Takahashi, Hideto Kubo, Ryosuke Tsutsumi, Shigeyuki Sakaki, Nobuyuki Zettsu, Yoshinori Nishino, Tetsuya Ishikawa, Kazuto Yamauchi
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Volume:
616
Year:
2010
Language:
english
Pages:
4
DOI:
10.1016/j.nima.2009.10.159
File:
PDF, 671 KB
english, 2010
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