Micrometry combined with profile mapping for the absolute...

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 2010 Vol. 619; Iss. 1-3

Micrometry combined with profile mapping for the absolute measurement of Integrated Column Density (ICD) and for accurate X-ray mass attenuation coefficients using XERT

M. Tauhidul Islam, Nicholas A. Rae, Jack L. Glover, Zwi Barnea, Christopher T. Chantler
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Volume:
619
Year:
2010
Language:
english
Pages:
3
DOI:
10.1016/j.nima.2009.10.162
File:
PDF, 183 KB
english, 2010
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