A novel imaging method for the pulse-shape characterization...

A novel imaging method for the pulse-shape characterization of position sensitive semiconductor radiation detectors

C. Domingo-Pardo, N. Goel, T. Engert, J. Gerl, I. Kojouharov, H. Schaffner, F. Didierjean, G. Duchêne, M.H. Sigward
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Volume:
643
Year:
2011
Language:
english
Pages:
10
DOI:
10.1016/j.nima.2011.04.021
File:
PDF, 1.19 MB
english, 2011
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