Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
2004 Vol. 226; Iss. 3
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Erratum to: “Secondary-ion mass spectrometry (SIMS) analysis of catalyst coatings used in microreactors” [Nucl. Instr. and Meth. B 219–220 (2004) 880–885]
Hubert Gnaser, Wolfgang Bock, Elisabeth Rowlett, Yong Men, Christiane Ziegler, Ralf Zapf, Volker HesselVolume:
226
Year:
2004
Language:
english
DOI:
10.1016/j.nimb.2004.07.011
File:
PDF, 339 KB
english, 2004