Studying of trap levels by the use of focused ion beams

Studying of trap levels by the use of focused ion beams

Z. Medunić, Ž. Pastuović, M. Jakšić, N. Skukan
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Volume:
231
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.nimb.2005.01.020
File:
PDF, 277 KB
english, 2005
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