High energy X-ray diffraction analysis of strain and...

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 2005 Vol. 238; Iss. 1-4

High energy X-ray diffraction analysis of strain and residual stress in silicon nitride ceramic diffusion bonds

M. Vila, C. Prieto, P. Miranzo, M.I. Osendi, A.E. Terry, G.B.M. Vaughan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
238
Year:
2005
Language:
english
Pages:
5
DOI:
10.1016/j.nimb.2005.06.030
File:
PDF, 151 KB
english, 2005
Conversion to is in progress
Conversion to is failed