White beam X-ray topographic measurement of spontaneous...

White beam X-ray topographic measurement of spontaneous strain in strontium titanate

T. Ozaki, K. Kusunose, H. Sakaue, H. Okamoto, K. Kajiwara, Y. Suzuki, Y. Chikaura
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Volume:
238
Year:
2005
Language:
english
Pages:
4
DOI:
10.1016/j.nimb.2005.06.058
File:
PDF, 197 KB
english, 2005
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