Processing and microstructural characterization of...

Journal of Materials Research 2003 / 4 Vol. 18; Iss. 4

Processing and microstructural characterization of sputter-deposited Ni/Ni3Al multilayered thin films

Sperling, Evan A., Banerjee, Rajarshi, Thompson, Gregory B., Fain, Jason P., Anderson, Peter M., Fraser, Hamish L.
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Volume:
18
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.2003.0134
Date:
April, 2003
File:
PDF, 373 KB
english, 2003
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