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[IEEE 2014 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2014.12.15-2014.12.17)] 2014 IEEE International Electron Devices Meeting - High performance ultra-thin body (2.4nm) poly-Si junctionless thin film transistors with a trench structure
Yeh, Mu-Shih, Wu, Yung-Chun, Wu, Min-Hsin, Jhan, Yi-Ruei, Chung, Ming-Hsien, Hung, Min-FengYear:
2014
Language:
english
DOI:
10.1109/IEDM.2014.7047115
File:
PDF, 1.59 MB
english, 2014