![](/img/cover-not-exists.png)
Tool wear monitoring using naïve Bayes classifiers
Karandikar, Jaydeep, McLeay, Tom, Turner, Sam, Schmitz, TonyVolume:
77
Language:
english
Journal:
The International Journal of Advanced Manufacturing Technology
DOI:
10.1007/s00170-014-6560-6
Date:
April, 2015
File:
PDF, 3.44 MB
english, 2015