Measurement technique for surface profiling in...

Optics Communications 2005 Vol. 254; Iss. 1-3

Measurement technique for surface profiling in low-coherence interferometry

Ribun Onodera, Hiroki Wakaumi, Yukihiro Ishii
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Volume:
254
Year:
2005
Language:
english
Pages:
6
DOI:
10.1016/j.optcom.2005.05.019
File:
PDF, 266 KB
english, 2005
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