A Power Efficient BIST TPG Method on Don’t Care Bit Based...

Journal of Electronic Testing 2015 / 2 Vol. 31; Iss. 1

A Power Efficient BIST TPG Method on Don’t Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering

Yuan, Haiying, Guo, Kun, Sun, Xun, Mei, Jiaping, Song, Hongying
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
31
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-015-5507-7
Date:
February, 2015
File:
PDF, 283 KB
english, 2015
Conversion to is in progress
Conversion to is failed