![](/img/cover-not-exists.png)
A Power Efficient BIST TPG Method on Don’t Care Bit Based 2-D Adjusting and Hamming Distance Based 2-D Reordering
Yuan, Haiying, Guo, Kun, Sun, Xun, Mei, Jiaping, Song, HongyingVolume:
31
Language:
english
Journal:
Journal of Electronic Testing
DOI:
10.1007/s10836-015-5507-7
Date:
February, 2015
File:
PDF, 283 KB
english, 2015