Direct measurement of free carrier nonlinearity in semiconductor-doped glass with picosecond pump–probe Z-scan experiment
K.S. Bindra, C.P. Singh, S.M. OakVolume:
271
Year:
2007
Language:
english
Pages:
5
DOI:
10.1016/j.optcom.2006.10.078
File:
PDF, 142 KB
english, 2007