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Analysis of material modifications induced during laser damage in SiO2 thin films
L. Gallais, J. Capoulade, F. Wagner, J.Y. Natoli, M. CommandréVolume:
272
Year:
2007
Language:
english
Pages:
6
DOI:
10.1016/j.optcom.2006.11.025
File:
PDF, 696 KB
english, 2007