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Rational methodological approach to evaluation of dose resistance of CMOS microcircuits with respect to low intensity effects
Boychenko, D. V., Kalashnikov, O. A., Karakozov, A. B., Nikiforov, A. Yu.Volume:
44
Language:
english
Journal:
Russian Microelectronics
DOI:
10.1134/S1063739715010035
Date:
January, 2015
File:
PDF, 286 KB
english, 2015