ECS Transactions [ECS 218th ECS Meeting - Las Vegas, NV (October 10 - October 15, 2010)] - (Invited) Identification of Intrinsic Point Defects at Ge
Stesmans, André, Nguyen, A. P. D., Afanas'ev, Valeri V., Lieten, R. R., Borghs, GustaafYear:
2010
Language:
english
DOI:
10.1149/1.3481633
File:
PDF, 473 KB
english, 2010