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TEM observation of Eu-doped GaN and fabrication of n-GaN/Eu:GaN/p-GaN structure
J. Sawahata, H. Bang, J.W. Seo, T. Tsukamoto, K. AkimotoVolume:
28
Year:
2006
Language:
english
Pages:
4
DOI:
10.1016/j.optmat.2005.09.016
File:
PDF, 259 KB
english, 2006