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Microstructural characterization of Al98.5wt. %Si1.0wt. %Cu0.5wt. % on chemical-vapor-deposited W
Pico, Carey A., Bonifield, Tom D.Volume:
8
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/JMR.1993.1001
Date:
May, 1993
File:
PDF, 2.13 MB
english, 1993