Terahertz Ellipsometry Using Electron-Beam Based Sources

MRS Proceedings 2008 / 1 Vol. 1108

Terahertz Ellipsometry Using Electron-Beam Based Sources

Hofmann, Tino, Herzinger, Craig M., Schade, Ulrich, Mross, Michael, Woollam, John A., Schubert, Mathias
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Volume:
1108
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1108-A08-04
Date:
January, 2008
File:
PDF, 107 KB
english, 2008
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