Progress toward Système International d'Unités traceable force metrology for nanomechanics
Pratt, Jon R., Smith, Douglas T., Newell, David B., Kramar, John A., Whitenton, EricVolume:
19
Language:
english
Journal:
Journal of Materials Research
DOI:
10.1557/jmr.2004.19.1.366
Date:
January, 2004
File:
PDF, 2.25 MB
english, 2004