A compact local binary pattern using maximization of mutual...

Pattern Recognition 2011 Vol. 44; Iss. 3

A compact local binary pattern using maximization of mutual information for face analysis

Bongjin Jun, Taewan Kim, Daijin Kim
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Volume:
44
Year:
2011
Language:
english
Pages:
12
DOI:
10.1016/j.patcog.2010.10.008
File:
PDF, 1.48 MB
english, 2011
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