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The Positron as a Probe for Studying Bulk and Defect Properties in Semiconductors
Doz. Dr. G. Dlubek, Prof. Dr. O. BrümmerVolume:
498
Year:
1986
Language:
english
Pages:
9
DOI:
10.1002/andp.19864980309
File:
PDF, 603 KB
english, 1986