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ECS Transactions [ECS 219th ECS Meeting - Montreal, QC, Canada (May 1 - May 6, 2011)] - Reliability Properties and Current Conduction Mechanisms of HfO
Chang, Kow-Ming, Chang, Ting-Chia, Chen, Shou-Hsien, Deng, I-ChungYear:
2011
Language:
english
DOI:
10.1149/1.3572328
File:
PDF, 971 KB
english, 2011