The Effect of Passivation SiON Layer on the Data Retention...

MRS Proceedings 2009 / 1 Vol. 1195

The Effect of Passivation SiON Layer on the Data Retention Reliability of NAND Flash

Jang, Younggeun, Lee, Kwangwook, Kim, Eunsoo, Cho, Jonghye, Shim, Jungmyoung, Kim, Sangdeok, Kim, Junggeun, Park, Sangwook, Lee, Byungseok, Kim, Jinwoong
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Volume:
1195
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-1195-B07-03
Date:
January, 2009
File:
PDF, 798 KB
english, 2009
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