Defects of the SiC/SiO2 interface: energetics of the...

Physica B: Condensed Matter 2003 Vol. 340-342; Iss. none

Defects of the SiC/SiO2 interface: energetics of the elementary steps of the oxidation reaction

P. Deák, A. Gali, J. Knaup, Z. Hajnal, Th. Frauenheim, P. Ordejón, J.W. Choyke
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
340-342
Year:
2003
Language:
english
Pages:
5
DOI:
10.1016/j.physb.2003.09.252
File:
PDF, 209 KB
english, 2003
Conversion to is in progress
Conversion to is failed