![](/img/cover-not-exists.png)
ECS Transactions [ECS 220th ECS Meeting - Boston, MA (October 9 - October 14, 2011)] - (Invited) In Situ Transmission Electron Microscopy Analysis of Conductive Filament in Resistance Random Access Memories
Takahashi, Yasuo, Fujii, Takashi, Arita, Masashi, Fujiwara, IchiroYear:
2011
Language:
english
DOI:
10.1149/1.3633287
File:
PDF, 551 KB
english, 2011