f-Level occupancy in TmTe under pressure investigated by...

f-Level occupancy in TmTe under pressure investigated by high-resolution X-ray absorption spectroscopy

I. Jarrige, J.-P. Rueff, S.R. Shieh, T. Matsumura, H. Ishii, N. Hiraoka, Y.Q. Cai
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Volume:
378-380
Year:
2006
Language:
english
Pages:
2
DOI:
10.1016/j.physb.2006.01.463
File:
PDF, 101 KB
english, 2006
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