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Piezoelectric coefficient of thin films measured by piezoresponse force microscopy
S.-H. Lee, C.-H. Yang, Y.H. Jeong, N.O. BirgeVolume:
383
Year:
2006
Language:
english
Pages:
2
DOI:
10.1016/j.physb.2006.03.043
File:
PDF, 97 KB
english, 2006