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X-ray diffraction stress analysis of ferroelectric thin films with ideal (h k l) textures considering the piezoelectric coupling effect
Huaping Wu, Linzhi Wu, Jiquan Li, Guozhong Chai, Shanyi DuVolume:
405
Year:
2010
Language:
english
Pages:
6
DOI:
10.1016/j.physb.2009.10.060
File:
PDF, 196 KB
english, 2010